New Product Introduction Reports

Improving Manufacturing Quality with Integrated Test and Statistical Analysis
sponsored by National Instruments
WHITE PAPER: With test management and statistical analysis integrated into an automated system, organizations can target problem components and processes in less time with more accuracy, reducing the cost of manufacturing quality products.
Posted: 01 Dec 2002 | Published: 01 Nov 2002

National Instruments

IBM Rational Workbench for Systems and Software Engineering
sponsored by IBM
WHITE PAPER: This white paper illustrates how proven methodologies and best-of-breed tools, such as Rational DOORS, Rational Rhapsody, Rational Team Concert, and Rational Quality Manager, can help you design high-quality products that meet customer requirements.
Posted: 07 Sep 2010 | Published: 30 Jun 2010

IBM

Strategies to Capture Greater Value from Systems Engineering
sponsored by IBM
WHITE PAPER: Access this helpful white paper to learn how you can capture greater value from systems engineering by embracing a more holistic approach to manage complexity in both product and process.
Posted: 11 Nov 2013 | Published: 11 Nov 2013

IBM

ExtraView Enterprise - Business Process Management Software
sponsored by Extraview Corporation
SOFTWARE LISTING: ExtraView Enterprise enables organizations to quickly and cost-effectively, create user specific web-based solutions that conform to a corporation's unique business processes and workflow requirements.
Posted: 10 Mar 2008 | Published: 10 Mar 2008

Extraview Corporation

CFD for Mechanical Design Engineers: “A Paradigm Shift for Better Design”
sponsored by Mentor Graphics
WHITE PAPER: This paper provides CIMdata’s perspective on Computational Fluid Dynamics (CFD) analysis, including its motivation for use, value and future. It also describes Mentor Graphics’ FloEFD CFD analysis solution that is designed to provide product designers and engineers with direct access to CFD techniques directly in their design (CAD) environment.
Posted: 10 Jun 2010 | Published: 10 Jun 2010

Mentor Graphics

Presentation Transcript: Getting More Out of your Development Testing
sponsored by Electric Cloud
PRESENTATION TRANSCRIPT: Consult this presentation transcript to learn more about how you can improve your development testing. It outlines best practices, processes, infrastructure and other helpful tips. Get the important answers you need in regards to development testing and static analysis by reading this resource now.
Posted: 06 Dec 2012 | Published: 06 Dec 2012

Electric Cloud

Address System-on-Chip Development Challenges with Enterprise Verification Management
sponsored by IBM
WHITE PAPER: This white paper addresses the multidimensional challenges posed by verification management and offers a compelling solution known as enterprise verification management solution (EVMS) based on over a decade of development and in-house experience at IBM. 
Posted: 02 Nov 2010 | Published: 01 Sep 2009

IBM

TestStand 2.0.1 – Reducing the Cost of Manufacturing Test
sponsored by National Instruments
WHITE PAPER: With TestStand, manufacturing test developers create automated test systems that dramatically reduce the cost of testing products by increasing throughput and reducing test development time.
Posted: 30 Apr 2002 | Published: 01 Apr 2002

National Instruments

Windows 10 Momentum Continues to Build
sponsored by Flexera Software
EGUIDE: In this expert e-guide, we examine how Windows 10 is growing as a highly productive development environment. Find out how the OS is generating new opportunities for developers and how it's impacting Microsoft's future in cloud, mobile, and more.
Posted: 31 Aug 2016 | Published: 31 Aug 2016

Flexera Software

Agile Product Development For Dummies
sponsored by IBM
EBOOK: Discover the answers for every question you ever wanted to ask about Agile development. Learn the benefits Agile approaches can bring to product development, the requirements to make an Agile transition work, and the 10 myths about Agile that could be holding you back.
Posted: 21 Jan 2016 | Published: 31 Dec 2015

IBM